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VLSI DESIGN, AUTOMATION AND TEST. INTERNATIONAL SYMPOSIUM. 2006.

VLSI DESIGN, AUTOMATION AND TEST. INTERNATIONAL SYMPOSIUM. 2006.

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VLSI DESIGN, AUTOMATION AND TEST. INTERNATIONAL SYMPOSIUM. 2006.
Item #: 00510
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Product Description
Title:2006 International Symposium on VLSI Design, Automation and Test
Desc:Proceedings of a meeting held 26-28 April 2006, Hsinchu, Taiwan.
Sponsor:Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:CFP06847-POD
ISBN:9781424401796
Pages:303 (1 Vol)
Format:Softcover
Publisher:Institute of Electrical and Electronics Engineers ( IEEE )
Notes: Authorized distributor of all IEEE proceedings
TOC:View Table of Contents
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