VLSI DESIGN, AUTOMATION AND TEST. INTERNATIONAL SYMPOSIUM. 2006.

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Title:	2006 International Symposium on VLSI Design, Automation and Test
Desc:	Proceedings of a meeting held 26-28 April 2006, Hsinchu, Taiwan.
Sponsor:	Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:	CFP06847-PRT
ISBN:	9781424401796
Pages:	303 (1 Vol)
Format:	Softcover
Publisher:	Institute of Electrical and Electronics Engineers ( IEEE )
Notes:	Authorized distributor of all IEEE proceedings
TOC:	View Table of Contents