WORKLOAD CHARACTERIZATION. IEEE INTERNATIONAL SYMPOSIUM. 9TH 2006.

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Title:	2006 IEEE International Symposium on Workload Characterization
Desc:	Proceedings of a meeting held 26-28 October 2006, San Jose, California.
Sponsor:	Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:	CFP06236-PRT
ISBN:	9781424405084
Pages:	218 (1 Vol)
Format:	Softcover
Publisher:	Institute of Electrical and Electronics Engineers ( IEEE )
Notes:	Authorized distributor of all IEEE proceedings
TOC:	View Table of Contents