MICROELECTRONIC TEST STRUCTURES. INTERNATIONAL CONFERENCE. 19TH 2006. 2006 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONICS TEST STRUCTURES

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Title:	2006 IEEE International Conference on Microelectronic Test Structures
Desc:	Proceedings of a meeting held 6-9 March 2006, Austin, Texas.
Sponsor:	Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:	CFP06MTS-PRT
ISBN:	9781424401673
Pages:	230 (1 Vol)
Format:	Softcover
Publisher:	Institute of Electrical and Electronics Engineers ( IEEE )
Notes:	Authorized distributor of all IEEE proceedings
TOC:	View Table of Contents