Details
- Title: 16th IEEE Asian Test Symposium (ATS 2007)
- Date/Location: Held 9-11 October 2007, Beijing, China.
- IEEE #: CFP07067-POD
- ISBN: 9780769528908
- Pages: 527 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2008 )
Description
Members/Attendees
Tab 4
- Title: 16th IEEE Asian Test Symposium (ATS 2007)
- Date/Location: Held 9-11 October 2007, Beijing, China.
- IEEE #: CFP07067-POD
- ISBN: 9780769528908
- Pages: 527 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2008 )