Details
- Title: 2008 IEEE International Conference on Microelectronic Test Structures
- Date/Location: Held 24-27 March 2008, Edinburgh, Scotland, UK.
- IEEE #: CFP08MTS-POD
- ISBN: 9781424418008
- Pages: 242 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2008 )
Description
Members/Attendees
Tab 4
- Title: 2008 IEEE International Conference on Microelectronic Test Structures
- Date/Location: Held 24-27 March 2008, Edinburgh, Scotland, UK.
- IEEE #: CFP08MTS-POD
- ISBN: 9781424418008
- Pages: 242 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2008 )