Details
- Title: Testing: Academic and Industrial Conference Practice and Research Techniques (TAIC PART 2008)
- Date/Location: Held 29-31 August 2008, Windsor, United Kingdom.
- IEEE #: CFP0896A-POD
- ISBN: 9780769533834
- Pages: 106 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2009 )
Description
Members/Attendees
Tab 4
- Title: Testing: Academic and Industrial Conference Practice and Research Techniques (TAIC PART 2008)
- Date/Location: Held 29-31 August 2008, Windsor, United Kingdom.
- IEEE #: CFP0896A-POD
- ISBN: 9780769533834
- Pages: 106 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2009 )