Details
- Title: 2008 IEEE International Test Conference (ITC)
- Date/Location: Held 28-30 October 2008, Santa Clara, California.
- IEEE #: CFP08ITC-POD
- ISBN: 9781424424023
- Pages: 1,062 (2 Vols)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2009 )
Description
Members/Attendees
Tab 4
- Title: 2008 IEEE International Test Conference (ITC)
- Date/Location: Held 28-30 October 2008, Santa Clara, California.
- IEEE #: CFP08ITC-POD
- ISBN: 9781424424023
- Pages: 1,062 (2 Vols)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2009 )