Details
- Title: 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2008)
- Date/Location: Held 1-3 October 2008, Boston, Massachusetts.
- Editor: Bolchini, C.
- IEEE #: CFP08078-POD
- ISBN: 9780769533650
- Pages: 546 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2009 )
Description
Members/Attendees
Tab 4
- Title: 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2008)
- Date/Location: Held 1-3 October 2008, Boston, Massachusetts.
- Editor: Bolchini, C.
- IEEE #: CFP08078-POD
- ISBN: 9780769533650
- Pages: 546 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2009 )