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TESTING AND DIAGNOSIS. IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE. 2009. (ICTD 2009)

TESTING AND DIAGNOSIS. IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE. 2009. (ICTD 2009)

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TESTING AND DIAGNOSIS. IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE. 2009. (ICTD 2009)
Item #: 05377
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Product Description
Title:2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD)
Desc:Proceedings of a meeting held 28-29 April 2009, Chengdu, Sichuan, China.
Sponsor:Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:CFP09CTD-PRT
ISBN:9781424425860
Pages:677 (1 Vol)
Format:Softcover
Publisher:Institute of Electrical and Electronics Engineers ( IEEE )
Notes: Authorized distributor of all IEEE proceedings
TOC:View Table of Contents
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