Details
- Title: 2009 Asian Test Symposium (ATS 2009)
- Date/Location: Held 23-26 November 2009, Taichung, Taiwan.
- IEEE #: CFP09067-POD
- ISBN: 9781424451296
- Pages: 461 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2010 )
Description
Members/Attendees
Tab 4
- Title: 2009 Asian Test Symposium (ATS 2009)
- Date/Location: Held 23-26 November 2009, Taichung, Taiwan.
- IEEE #: CFP09067-POD
- ISBN: 9781424451296
- Pages: 461 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2010 )