Details
- Title: 2009 International Conference on Test and Measurement (ICTM 2009)
- Date/Location: Held 5-6 December 2009, Hong Kong.
- Editor: Luo, Q.
- IEEE #: CFP0951H-POD
- ISBN: 9781424446995
- Pages: 876 (2 Vols)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2010 )
Description
Members/Attendees
Tab 4
- Title: 2009 International Conference on Test and Measurement (ICTM 2009)
- Date/Location: Held 5-6 December 2009, Hong Kong.
- Editor: Luo, Q.
- IEEE #: CFP0951H-POD
- ISBN: 9781424446995
- Pages: 876 (2 Vols)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2010 )