Details
- Title: 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT 2010)
- Date/Location: Held 26-29 April 2010, Hsin Chu, Taiwan.
- IEEE #: CFP10847-POD
- ISBN: 9781424452699
- Pages: 366 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Aug 2010 )
Description
Members/Attendees
Tab 4
- Title: 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT 2010)
- Date/Location: Held 26-29 April 2010, Hsin Chu, Taiwan.
- IEEE #: CFP10847-POD
- ISBN: 9781424452699
- Pages: 366 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Aug 2010 )