PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. IEEE INTERNATIONAL SYMPOSIUM. 17TH 2010. (IPFA 2010) (CD-ROM)

PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. IEEE INTERNATIONAL SYMPOSIUM. 17TH 2010. (IPFA 2010) (CD-ROM)

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008826
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  • Title: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010)
  • Date/Location: Held 5-9 July 2010, Singapore.
  • IEEE #: CFP10777-CDR
  • ISBN: 9781424455973
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Aug 2010 )

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  • Title: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010)
  • Date/Location: Held 5-9 July 2010, Singapore.
  • IEEE #: CFP10777-CDR
  • ISBN: 9781424455973
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Aug 2010 )