SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM. ANNUAL IEEE. 28TH 2012. (SEMI-THERM 2012)

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014782
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  • Title: 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM 2012)
  • Date/Location: Held 18-22 March 2012, San Jose, California, USA.
  • IEEE #: CFP12SEM-POD
  • ISBN: 9781467311106
  • Pages: 367 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( May 2012 )

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  • Title: 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM 2012)
  • Date/Location: Held 18-22 March 2012, San Jose, California, USA.
  • IEEE #: CFP12SEM-POD
  • ISBN: 9781467311106
  • Pages: 367 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( May 2012 )