MICROELECTRONIC TEST STRUCTURES. IEEE INTERNATIONAL CONFERENCE. 2012. (ICMTS 2012) (USB)

MICROELECTRONIC TEST STRUCTURES. IEEE INTERNATIONAL CONFERENCE. 2012. (ICMTS 2012) (USB)

Item #:
014818
$110.50 - $221.00
Adding to cart… The item has been added

Details

  • Title: 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS 2012)
  • Date/Location: Held 19-22 March 2012, San Diego, California, USA.
  • IEEE #: CFP12MTS-USB
  • ISBN: 9781467310307
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( May 2012 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS 2012)
  • Date/Location: Held 19-22 March 2012, San Diego, California, USA.
  • IEEE #: CFP12MTS-USB
  • ISBN: 9781467310307
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( May 2012 )