Details
- Title: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2012)
- Date/Location: Held 3-5 October 2012, Austin, Texas, USA.
- IEEE #: CFP12078-POD
- ISBN: 9781467330435
- Pages: 244 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2013 )
Description
Members/Attendees
Tab 4
- Title: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2012)
- Date/Location: Held 3-5 October 2012, Austin, Texas, USA.
- IEEE #: CFP12078-POD
- ISBN: 9781467330435
- Pages: 244 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2013 )