Details
- Title: 2012 IEEE International Test Conference (ITC 2012)
- Date/Location: Held 5-8 November 2012, Anaheim, California, USA.
- IEEE #: CFP12ITC-POD
- ISBN: 9781467315944
- Pages: 581 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2013 )
Description
Members/Attendees
Tab 4
- Title: 2012 IEEE International Test Conference (ITC 2012)
- Date/Location: Held 5-8 November 2012, Anaheim, California, USA.
- IEEE #: CFP12ITC-POD
- ISBN: 9781467315944
- Pages: 581 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2013 )