Details
- Title: 2012 IEEE 21st Asian Test Symposium (ATS 2012)
- Date/Location: Held 19-22 November 2012, Niigata, Japan.
- IEEE #: CFP12067-POD
- ISBN: 9781467345552
- Pages: 364 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2013 )
Description
Members/Attendees
Tab 4
- Title: 2012 IEEE 21st Asian Test Symposium (ATS 2012)
- Date/Location: Held 19-22 November 2012, Niigata, Japan.
- IEEE #: CFP12067-POD
- ISBN: 9781467345552
- Pages: 364 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2013 )