DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 2012. (DFT 2012) (CD-ROM)

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017025
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  • Title: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2012)
  • Date/Location: Held 3-5 October 2012, Austin, Texas, USA.
  • IEEE #: CFP12078-CDR
  • ISBN: 9781467330428
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2013 )

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  • Title: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2012)
  • Date/Location: Held 3-5 October 2012, Austin, Texas, USA.
  • IEEE #: CFP12078-CDR
  • ISBN: 9781467330428
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2013 )