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VLSI TEST SYMPOSIUM. IEEE. 31ST 2013. (VTS 2013)

VLSI TEST SYMPOSIUM. IEEE. 31ST 2013. (VTS 2013)

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VLSI TEST SYMPOSIUM. IEEE. 31ST 2013. (VTS 2013)
Item #: 18529
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Product Description
Title:2013 IEEE 31st VLSI Test Symposium (VTS 2013)
Desc:Proceedings of a meeting held 29 April - 2 May 2013, Berkeley, California, USA.
Sponsor:Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:CFP13029-POD
ISBN:9781467355421
Pages:286 (1 Vol)
Format:Softcover
Publisher:Institute of Electrical and Electronics Engineers ( IEEE )
Notes: Authorized distributor of all IEEE proceedings
TOC:View Table of Contents
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