Details
- Title: 2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology & Application (FENDT 2013)
- Date/Location: Held 17-20 June 2013, Jinan, China.
- IEEE #: CFP1310U-CDR
- ISBN: 9781467360197
- Format: CD-ROM
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Nov 2013 )
Description
Members/Attendees
Tab 4
- Title: 2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology & Application (FENDT 2013)
- Date/Location: Held 17-20 June 2013, Jinan, China.
- IEEE #: CFP1310U-CDR
- ISBN: 9781467360197
- Format: CD-ROM
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Nov 2013 )