DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 2013. (DFTS 2013) (CD-ROM)

DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 2013. (DFTS 2013) (CD-ROM)

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  • Title: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2013)
  • Date/Location: Held 2-4 October 2013, New York City, New York, USA.
  • IEEE #: CFP13078-CDR
  • ISBN: 9781479915835
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Dec 2013 )

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  • Title: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2013)
  • Date/Location: Held 2-4 October 2013, New York City, New York, USA.
  • IEEE #: CFP13078-CDR
  • ISBN: 9781479915835
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Dec 2013 )