Details
- Title: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014)
- Date/Location: Held 1-3 October 2014, Amsterdam, Netherlands.
- IEEE #: CFP14078-POD
- ISBN: 9781479961566
- Pages: 304 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2015 )
Description
Members/Attendees
Tab 4
- Title: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014)
- Date/Location: Held 1-3 October 2014, Amsterdam, Netherlands.
- IEEE #: CFP14078-POD
- ISBN: 9781479961566
- Pages: 304 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2015 )