Details
- Title: 2014 IEEE International Test Conference (ITC 2014)
- Date/Location: Held 20-23 October 2014, Seattle, Washington, USA.
- IEEE #: CFP14ITC-POD
- ISBN: 9781479947218
- Pages: 601 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2015 )
Description
Members/Attendees
Tab 4
- Title: 2014 IEEE International Test Conference (ITC 2014)
- Date/Location: Held 20-23 October 2014, Seattle, Washington, USA.
- IEEE #: CFP14ITC-POD
- ISBN: 9781479947218
- Pages: 601 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2015 )