Details
- Title: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2016)
- Date/Location: Held 19-20 September 2016, Storrs, Connecticut, USA.
- IEEE #: CFP16078-POD
- ISBN: 9781509036240
- Pages: 159 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2016 )
Description
Members/Attendees
Tab 4
- Title: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2016)
- Date/Location: Held 19-20 September 2016, Storrs, Connecticut, USA.
- IEEE #: CFP16078-POD
- ISBN: 9781509036240
- Pages: 159 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2016 )