 Title: | 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR 2016) | Desc: | Proceedings of a meeting held 28-30 September 2016, Pensacola Beach, Florida, USA.
| Prod#: | CFP16AST-POD | ISBN: | 9781509018819 | Pages: | 99 (1 Vol) | Format: | Softcover | Notes: | Authorized distributor of all IEEE proceedings | TOC: | View Table of Contents | Publ: | Institute of Electrical and Electronics Engineers ( IEEE ) | POD Publ: | Curran Associates, Inc. ( Jan 2017 ) |
| |  |