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ACCELERATED STRESS TESTING AND RELIABILITY CONFERENCE. IEEE. 2016. (ASTR 2016)
ACCELERATED STRESS TESTING AND RELIABILITY CONFERENCE. IEEE. 2016. (ASTR 2016)
Item #: 32486
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Title:
2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR 2016)
Desc:
Proceedings of a meeting held 28-30 September 2016, Pensacola Beach, Florida, USA.
Prod#:
CFP16AST-POD
ISBN:
9781509018819
Pages:
99 (1 Vol)
Format:
Softcover
Notes:
Authorized distributor of all IEEE proceedings
TOC:
View Table of Contents
Publ:
Institute of Electrical and Electronics Engineers ( IEEE )
POD Publ:
Curran Associates, Inc. ( Jan 2017 )
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