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APPLIED OPTICAL METROLOGY II

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APPLIED OPTICAL METROLOGY II
Item #: 46556
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Product Description
Title:Applied Optical Metrology II
Desc:Proceedings of a meeting held 8-9 August 2017, San Diego, California, USA. At SPIE Optical Engineering + Applications
Series:Proceedings of SPIE Volume 10373
Editor:Novak, Erik
ISBN:9781510612037
Pages:292 (1 Vol)
Format:Softcover
TOC:View Table of Contents
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Dec 2017 )
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