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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING

INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING

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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING
Item #: 42908
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Product Description
Title:Instrumentation, Metrology, and Standards for Nanomanufacturing
Desc:Proceedings of a meeting held 29-30 August 2007, San Diego, California, USA. At NanoScience + Engineering
Series:Proceedings of SPIE Volume 6648
Editor:Postek, Michael T.
ISBN:9780819467966
Pages:190 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Sep 2007 )
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