ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES III

Item #: 42932

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Title:	Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
Desc:	Proceedings of a meeting held 28-29 August 2007, San Diego, California, USA. At Optical Engineering + Applications
Series:	Proceedings of SPIE Volume 6672
Editor:	Duparre, Angela
ISBN:	9780819468208
Pages:	250 (1 Vol) (approx)
Format:	Softcover
Publ:	SPIE - International Society For Optics and Photonics
POD Publ:	Curran Associates, Inc. ( Sep 2007 )