Conference Proceedings
Home
 > 
Browse by Publisher
 > 
SPIE - International Society For Optics and Photonics
 > 
ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES III

ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES III

Send a Friend    
ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES III
Item #: 42932
Our Price:   
$105.00
Product Description
Title:Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
Desc:Proceedings of a meeting held 28-29 August 2007, San Diego, California, USA. At Optical Engineering + Applications
Series:Proceedings of SPIE Volume 6672
Editor:Duparre, Angela
ISBN:9780819468208
Pages:250 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Sep 2007 )
Related Products
Browse By PublisherShop By Category
Dave A Curran, EzineArticles.com Basic Author