 Title: | Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III | Desc: | Proceedings of a meeting held 28-29 August 2007, San Diego, California, USA.
At Optical Engineering + Applications | Series: | Proceedings of SPIE Volume 6672 | Editor: | Duparre, Angela | ISBN: | 9780819468208 | Pages: | 250 (1 Vol) (approx) | Format: | Softcover | Publ: | SPIE - International Society for Optics and Photonics | POD Publ: | Curran Associates, Inc. ( Sep 2007 ) |
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