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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING II

INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING II

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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING II
Item #: 43298
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Product Description
Title:Instrumentation, Metrology, and Standards for Nanomanufacturing II
Desc:Proceedings of a meeting held 10 August 2008, San Diego, California, USA. At NanoScience + Engineering
Series:Proceedings of SPIE Volume 7042
Editor:Postek, Michael T.
ISBN:9780819472625
Pages:200 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Aug 2008 )
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