Conference Proceedings
Home
 > 
Browse by Publisher
 > 
SPIE - International Society For Optics and Photonics
 > 
INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING III

INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING III

Send a Friend    
INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING III
Item #: 43661
Our Price:   
$80.00
Product Description
Title:Instrumentation, Metrology, and Standards for Nanomanufacturing III
Desc:Proceedings of a meeting held 4-5 August 2009, San Diego, California, USA. At SPIE NanoScience + Engineering
Series:Proceedings of SPIE Volume 7405
Editor:Postek, Michael T.
ISBN:9780819476951
Pages:276 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Aug 2009 )
Related Products
Browse By PublisherShop By Category
Dave A Curran, EzineArticles.com Basic Author