2009 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

Item #: 43767

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Title:	2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Desc:	Proceedings of a meeting held 19-22 October 2009, Shanghai, China. At International Conference on Optical Instrumentation and Technology
Series:	Proceedings of SPIE Volume 7511
Editor:	Ye, Shenghua
ISBN:	9780819478979
Pages:	646 (1 Vol) (approx)
Format:	Softcover
Publ:	SPIE - International Society for Optics and Photonics
POD Publ:	Curran Associates, Inc. ( Nov 2009 )