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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING IV

INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING IV

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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING IV
Item #: 44023
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Product Description
Title:Instrumentation, Metrology, and Standards for Nanomanufacturing IV
Desc:Proceedings of a meeting held 2-3 August 2010, San Diego, California, USA. At SPIE NanoScience + Engineering
Series:Proceedings of SPIE Volume 7767
Editor:Postek, Michael T.
ISBN:9780819482631
Pages:178 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Aug 2010 )
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