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2011 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

2011 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

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2011 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS
Item #: 44457
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Product Description
Title:2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Desc:Proceedings of a meeting held 6-9 November 2011, Beijing, Beijing, China.
Series:Proceedings of SPIE Volume 8201
Editor:Dong, Xinyong
ISBN:9780819488428
Pages:660 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Dec 2011 )
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