OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II

Item #: 44819

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Title:	Optical Metrology and Inspection for Industrial Applications II
Desc:	Proceedings of a meeting held 5-8 November 2012, Beijing, China. At Photonics Asia
Series:	Proceedings of SPIE Volume 8563
Editor:	Harding, Kevin G.
ISBN:	9780819493187
Pages:	328 (1 Vol) (approx)
Format:	Softcover
Publ:	SPIE - International Society For Optics and Photonics
POD Publ:	Curran Associates, Inc. ( Jan 2013 )