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2013 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

2013 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

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2013 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS
Item #: 45302
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Product Description
Title:2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Desc:Proceedings of a meeting held 17-19 November 2013, Beijing, China.
Series:Proceedings of SPIE Volume 9046
Editor:Tam, Hwa-Yaw
ISBN:9780819499646
Pages:444 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Dec 2013 )
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