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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VIII

INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VIII

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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VIII
Item #: 45429
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Product Description
Title:Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Desc:Proceedings of a meeting held 20 August 2014, San Diego, California, USA. At SPIE NanoScience + Engineering
Series:Proceedings of SPIE Volume 9173
Editor:Postek, Michael T.
ISBN:9781628412000
Pages:98 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society for Optics and Photonics
POD Publ:Curran Associates, Inc. ( Sep 2014 )
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