INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VIII

Item #: 45429

Our Price:

$60.00

Title:	Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Desc:	Proceedings of a meeting held 20 August 2014, San Diego, California, USA. At SPIE NanoScience + Engineering
Series:	Proceedings of SPIE Volume 9173
Editor:	Postek, Michael T.
ISBN:	9781628412000
Pages:	98 (1 Vol) (approx)
Format:	Softcover
Publ:	SPIE - International Society for Optics and Photonics
POD Publ:	Curran Associates, Inc. ( Sep 2014 )