Conference Proceedings
Home
 > 
Browse by Publisher
 > 
SPIE - International Society For Optics and Photonics
 > 
ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS V

ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS V

Send a Friend    
ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS V
Item #: 45462
Our Price:   
$70.00
Product Description
Title:Advances in Metrology for X-Ray and EUV Optics V
Desc:Proceedings of a meeting held 18 August 2014, San Diego, California, USA. At SPIE Optical Engineering + Applications
Series:Proceedings of SPIE Volume 9206
Editor:Assoufid, Lahsen
ISBN:9781628412338
Pages:158 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Oct 2014 )
Related Products
Browse By PublisherShop By Category
Dave A Curran, EzineArticles.com Basic Author