8TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: SUBNANOMETER ACCURACY MEASUREMENT FOR SYNCHROTRON OPTICS AND X-RAY OPTICS

Item #: 45939

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Title:	8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
Desc:	Proceedings of a meeting held 26-29 April 2016, Suzhou, China.
Series:	Proceedings of SPIE Volume 9687
Editor:	Qian, Shinan
ISBN:	9781628419221
Pages:	126 (1 Vol) (approx)
Format:	Softcover
Publ:	SPIE - International Society For Optics and Photonics
POD Publ:	Curran Associates, Inc. ( Nov 2016 )