 Title: | 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics | Desc: | Proceedings of a meeting held 26-29 April 2016, Suzhou, China.
| Series: | Proceedings of SPIE Volume 9687 | Editor: | Qian, Shinan | ISBN: | 9781628419221 | Pages: | 126 (1 Vol) (approx) | Format: | Softcover | Publ: | SPIE - International Society for Optics and Photonics | POD Publ: | Curran Associates, Inc. ( Nov 2016 ) |
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