SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM. ANNUAL IEEE. 23RD 2007.

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Title:	Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Desc:	Proceedings of a meeting held 20-22 March 2007, San Jose, California.
Sponsor:	Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:	CFP07SEM-PRT
ISBN:	9781424409587
Pages:	261 (1 Vol)
Format:	Softcover
Publisher:	Institute of Electrical and Electronics Engineers ( IEEE )
Notes:	Authorized distributor of all IEEE proceedings
TOC:	View Table of Contents