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COMPUTATIONAL INTELLIGENCE FOR MEASUREMENT SYSTEMS AND APPLICATIONS. IEEE INTERNATIONAL CONFERENCE. 2007.

COMPUTATIONAL INTELLIGENCE FOR MEASUREMENT SYSTEMS AND APPLICATIONS. IEEE INTERNATIONAL CONFERENCE. 2007.

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COMPUTATIONAL INTELLIGENCE FOR MEASUREMENT SYSTEMS AND APPLICATIONS. IEEE INTERNATIONAL CONFERENCE. 2007.
Item #: 01997
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Product Description
Title:2007 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications
Desc:Proceedings of a meeting held 27-29 June 2007, Ostuni, Italy.
Sponsor:Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:CFP07CIM-POD
ISBN:9781424408238
Pages:115 (1 Vol)
Format:Softcover
Publisher:Institute of Electrical and Electronics Engineers ( IEEE )
Notes: Authorized distributor of all IEEE proceedings
TOC:View Table of Contents
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