ANALYTICAL TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND PROCESS CHARACTERIZATION. SYMPOSIUM. 5TH 2007. ALTECH 2007

Item #: 02357

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Title:	Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007)
Desc:	Proceedings of a meeting held 13-14 September 2007, Munich, Germany.
Series:	ECS Transactions Volume 10 No.01
Sponsor:	Electrochemical Society ( ECS )
Editor:	Kolbesen, B.O.
ISBN:	9781604238259
Pages:	161 (1 Vol)
Format:	Softcover
Publisher:	Curran Associates, Inc. ( Mar 2008 )