COMPUTATIONAL INTELLIGENCE FOR MEASUREMENT SYSTEMS AND APPLICATIONS. IEEE INTERNATIONAL CONFERENCE. 2008.

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003377
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  • Title: 2008 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications
  • Date/Location: Held 14-16 July 2008, Istanbul, Turkey.
  • IEEE #: CFP08CIM-POD
  • ISBN: 9781424423057
  • Pages: 136 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Nov 2008 )

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  • Title: 2008 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications
  • Date/Location: Held 14-16 July 2008, Istanbul, Turkey.
  • IEEE #: CFP08CIM-POD
  • ISBN: 9781424423057
  • Pages: 136 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Nov 2008 )