PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. IEEE INTERNATIONAL SYMPOSIUM. 15TH 2008. (CD-ROM) IPFA 2008

PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. IEEE INTERNATIONAL SYMPOSIUM. 15TH 2008. (CD-ROM) IPFA 2008

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Details

  • Title: 2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
  • Date/Location: Held 7-11 July 2008, Singapore.
  • IEEE #: CFP08777-CDR
  • ISBN: 9781424420407
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Dec 2008 )

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  • Title: 2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
  • Date/Location: Held 7-11 July 2008, Singapore.
  • IEEE #: CFP08777-CDR
  • ISBN: 9781424420407
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Dec 2008 )