DESIGN AND TEST OF NANO DEVICES, CIRCUITS AND SYSTEMS. IEEE INTERNATIONAL WORKSHOP. 2008. NDCS 2008

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004010
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  • Title: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS 2008)
  • Date/Location: Held 29-30 September 2008, Cambridge, Massachusetts.
  • IEEE #: CFP08NDC-POD
  • ISBN: 9780769533797
  • Pages: 85 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2009 )

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  • Title: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS 2008)
  • Date/Location: Held 29-30 September 2008, Cambridge, Massachusetts.
  • IEEE #: CFP08NDC-POD
  • ISBN: 9780769533797
  • Pages: 85 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2009 )