DESIGN, TEST, INTEGRATION AND PACKAGING OF MEMS/MOEMS. SYMPOSIUM. 2008.

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004485
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Details

  • Title: 2008 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)
  • Date/Location: Held 9-11 April 2008, Nice, France.
  • Editor: Bright, V.M.
  • IEEE #: CFP08DTI-POD
  • ISBN: 9781424438266
  • Pages: 392 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2009 )

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  • Title: 2008 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)
  • Date/Location: Held 9-11 April 2008, Nice, France.
  • Editor: Bright, V.M.
  • IEEE #: CFP08DTI-POD
  • ISBN: 9781424438266
  • Pages: 392 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2009 )