Details
- Title: 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Date/Location: Held 30 March - 2 April 2009, Oxnard, California.
- IEEE #: CFP09MTS-POD
- ISBN: 9781424442584
- Pages: 230 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jun 2009 )
Description
Members/Attendees
Tab 4
- Title: 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Date/Location: Held 30 March - 2 April 2009, Oxnard, California.
- IEEE #: CFP09MTS-POD
- ISBN: 9781424442584
- Pages: 230 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jun 2009 )