Details
- Title: 2008 Annual Reliability and Maintainability Symposium - Product Quality & Integrity (RAMS)
- Date/Location: Held 28-31 January 2008, Las Vegas, Nevada.
- IEEE #: CFP08RAM-POD
- ISBN: 9781424414604
- Pages: 516 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jun 2009 )
Description
Members/Attendees
Tab 4
- Title: 2008 Annual Reliability and Maintainability Symposium - Product Quality & Integrity (RAMS)
- Date/Location: Held 28-31 January 2008, Las Vegas, Nevada.
- IEEE #: CFP08RAM-POD
- ISBN: 9781424414604
- Pages: 516 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jun 2009 )