PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. IEEE INTERNATIONAL SYMPOSIUM. 16TH 2009. (IPFA 2009) (CD-ROM)

PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. IEEE INTERNATIONAL SYMPOSIUM. 16TH 2009. (IPFA 2009) (CD-ROM)

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006081
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  • Title: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2009)
  • Date/Location: Held 6-10 July 2009, Suzhou, Jiangsu, China.
  • IEEE #: CFP09777-CDR
  • ISBN: 9781424439126
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Sep 2009 )

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  • Title: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2009)
  • Date/Location: Held 6-10 July 2009, Suzhou, Jiangsu, China.
  • IEEE #: CFP09777-CDR
  • ISBN: 9781424439126
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Sep 2009 )