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ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 1ST 2009. (VALID 2009)

ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 1ST 2009. (VALID 2009)

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ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 1ST 2009. (VALID 2009)
Item #: 06367
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Product Description
Title:2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID 2009)
Desc:Proceedings of a meeting held 20-25 September 2009, Porto, Portugal.
Sponsor:Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:CFP0971H-POD
ISBN:9781424448623
Pages:166 (1 Vol)
Format:Softcover
Publisher:Institute of Electrical and Electronics Engineers ( IEEE )
Notes: Authorized distributor of all IEEE proceedings
TOC:View Table of Contents
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